Title :
A New Operational Tests Circuit for Testing ±660kV UHVDC Thyristor Valves
Author :
Xie Ting ; Guang-fu, Tang ; Kun-peng, Zha ; Chong, Gao
Author_Institution :
Dept. of Electr. Eng., Tsinghua Univ., Beijing, China
Abstract :
Operational test is an important measure which can guarantee safe and stable operation of UHVDC thyristor valves. HVDC thyristor modules can be performed either in a six-pulse back-to-back test circuit or in a synthetic test circuit. UHVDC thyristor valves have a high power rating and are difficult to test in a back-to-back test circuit. A synthetic test circuit can reach a high capacity with few installed capacity. This paper introduces a new synthetic circuit which can present the practical stress of ultrahigh voltage direct current (UHVDC) thyristor valves. Effective tests verify the circuit was successful.
Keywords :
circuit testing; thyristor applications; HVDC thyristor modules; UHVDC thyristor valves; operational test circuit; six-pulse back-to-back test circuit; synthetic test circuit; ultrahigh voltage direct current thyristor valves; Circuit faults; Fault currents; HVDC transmission; Stress; Thyristors; Valves; HVDC thyristor valve; operational tests; synthetic test circuit;
Conference_Titel :
Electrical and Control Engineering (ICECE), 2010 International Conference on
Conference_Location :
Wuhan
Print_ISBN :
978-1-4244-6880-5
DOI :
10.1109/iCECE.2010.775