• DocumentCode
    2974692
  • Title

    A New Operational Tests Circuit for Testing ±660kV UHVDC Thyristor Valves

  • Author

    Xie Ting ; Guang-fu, Tang ; Kun-peng, Zha ; Chong, Gao

  • Author_Institution
    Dept. of Electr. Eng., Tsinghua Univ., Beijing, China
  • fYear
    2010
  • fDate
    25-27 June 2010
  • Firstpage
    3177
  • Lastpage
    3180
  • Abstract
    Operational test is an important measure which can guarantee safe and stable operation of UHVDC thyristor valves. HVDC thyristor modules can be performed either in a six-pulse back-to-back test circuit or in a synthetic test circuit. UHVDC thyristor valves have a high power rating and are difficult to test in a back-to-back test circuit. A synthetic test circuit can reach a high capacity with few installed capacity. This paper introduces a new synthetic circuit which can present the practical stress of ultrahigh voltage direct current (UHVDC) thyristor valves. Effective tests verify the circuit was successful.
  • Keywords
    circuit testing; thyristor applications; HVDC thyristor modules; UHVDC thyristor valves; operational test circuit; six-pulse back-to-back test circuit; synthetic test circuit; ultrahigh voltage direct current thyristor valves; Circuit faults; Fault currents; HVDC transmission; Stress; Thyristors; Valves; HVDC thyristor valve; operational tests; synthetic test circuit;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical and Control Engineering (ICECE), 2010 International Conference on
  • Conference_Location
    Wuhan
  • Print_ISBN
    978-1-4244-6880-5
  • Type

    conf

  • DOI
    10.1109/iCECE.2010.775
  • Filename
    5629602