DocumentCode
2974692
Title
A New Operational Tests Circuit for Testing ±660kV UHVDC Thyristor Valves
Author
Xie Ting ; Guang-fu, Tang ; Kun-peng, Zha ; Chong, Gao
Author_Institution
Dept. of Electr. Eng., Tsinghua Univ., Beijing, China
fYear
2010
fDate
25-27 June 2010
Firstpage
3177
Lastpage
3180
Abstract
Operational test is an important measure which can guarantee safe and stable operation of UHVDC thyristor valves. HVDC thyristor modules can be performed either in a six-pulse back-to-back test circuit or in a synthetic test circuit. UHVDC thyristor valves have a high power rating and are difficult to test in a back-to-back test circuit. A synthetic test circuit can reach a high capacity with few installed capacity. This paper introduces a new synthetic circuit which can present the practical stress of ultrahigh voltage direct current (UHVDC) thyristor valves. Effective tests verify the circuit was successful.
Keywords
circuit testing; thyristor applications; HVDC thyristor modules; UHVDC thyristor valves; operational test circuit; six-pulse back-to-back test circuit; synthetic test circuit; ultrahigh voltage direct current thyristor valves; Circuit faults; Fault currents; HVDC transmission; Stress; Thyristors; Valves; HVDC thyristor valve; operational tests; synthetic test circuit;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical and Control Engineering (ICECE), 2010 International Conference on
Conference_Location
Wuhan
Print_ISBN
978-1-4244-6880-5
Type
conf
DOI
10.1109/iCECE.2010.775
Filename
5629602
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