Title :
Designing a key performance indicator system for technological innovation audit at firm´s level: A framework and an empirical study
Author :
Zheng, Hai-ao ; Chanaron, Jean-Jacques ; You, Jian-xin ; Chen, Xiao-li
Author_Institution :
Sch. of Econ. & Manage., Tongji Univ., Shanghai, China
Abstract :
This research aims at taking a further step in developing a methodology framework of innovation performance audit. With adopting the ideology of performance measurement system, a framework of key performance indicator(KPI) system including three level issues of `what is input´, `what is done´ and `what happens´ is designed for technological innovation audit, which can reflect the performance of technological innovation at firm´s level comprehensively. Furthermore, a questionnaire survey on line is conducted to test the validity of the key performance indicator system. Based on data analysis, the KPI system is proved to be effective as a whole, of which most indicators not only are important, but also could be measured easily in firms. Finally, in-depth innovation performance audit of four hi-tech firms is taken as a case study to verify the validity of the KPI system.
Keywords :
auditing; innovation management; technology management; data analysis; innovation performance audit; key performance indicator system; methodology framework; performance measurement system; technological innovation audit; Chemical technology; Economic indicators; Innovation management; Measurement; Production facilities; Research and development; System testing; Technological innovation; Technology management; Technology planning; Technological innovation audit; key performance indicator; performance measurement;
Conference_Titel :
Industrial Engineering and Engineering Management, 2009. IEEM 2009. IEEE International Conference on
Conference_Location :
Hong Kong
Print_ISBN :
978-1-4244-4869-2
Electronic_ISBN :
978-1-4244-4870-8
DOI :
10.1109/IEEM.2009.5373498