Title :
Analysis and Measurement of Spurious Emission and Phase Noise Performance of an RF All-Digital Phase Locked Loop using a Frequency Discriminator
Author :
Wicpalek, C. ; Mayer, T. ; Maurer, L. ; Vollenbruch, U. ; Liu, Y. ; Springer, A.
Author_Institution :
Univ. of Linz, Linz
Abstract :
A frequency discriminator in all-digital phase locked loops (ADPLLs) for RF-synthesis has to fulfill several tough requirements. The most important requirements are the in-band phase noise performance and knowledge about offset frequencies of the spurious emissions, because the ADPLL should fulfill several wireless communication standard requirements like UMTS and GSM. This paper presents a theoretical derivation, simulative analysis, and measurement results for the in-band phase noise level and the offset frequencies of spurious emissions of an ADPLL with a two-bit Frequency Discriminator implemented in a standard 0.13 mum CMOS technology
Keywords :
3G mobile communication; CMOS digital integrated circuits; cellular radio; digital phase locked loops; discriminators; phase noise; CMOS technology; GSM; RF all-digital phase locked loop; UMTS; frequency discriminator; inband phase noise performance; phase noise performance; size 0.13 mum; spurious emission measurement; wireless communication; CMOS technology; Frequency locked loops; Frequency measurement; Noise measurement; Performance analysis; Phase locked loops; Phase measurement; Phase noise; Radio frequency; Wireless communication; All Digital Phase Locked Loops; Mobile Communications; Phase Locked Loops; Sigma-Delta Modulation;
Conference_Titel :
Microwave Symposium, 2007. IEEE/MTT-S International
Conference_Location :
Honolulu, HI
Print_ISBN :
1-4244-0688-9
Electronic_ISBN :
0149-645X
DOI :
10.1109/MWSYM.2007.380398