Title :
Multitaper estimators for bispectra
Author :
Birkelund, Y. ; Hanssen, Alfred
Author_Institution :
Dept. of Phys., Tromso Univ., Norway
Abstract :
We have compared the bias and variance properties of a multitaper based class of bispectral estimators, with those of frequency smoothed biperiodograms, and a Hann-tapered/frequency-smoothed biperiodogram. The test processes are a white Gaussian process, a Poisson-driven MA(1) process, and a Poisson-driven AR(2) process. We found that the bias and variance properties of the mulitaper bispectral estimators are governed mainly by a quantity we call the total bispectral window. We conclude that for bispectra with a small dynamical range, the multitaper based estimators are superior, but for bispectra with a large dynamical range are the statistical properties of the Hann-tapered/frequency-smoothed estimator indistinguishable from those of the multitaper estimator
Keywords :
Gaussian processes; autoregressive processes; higher order statistics; moving average processes; parameter estimation; spectral analysis; Hann-tapered/frequency-smoothed biperiodogram; Poisson-driven AR(2) process; Poisson-driven MA(1) process; bias properties; bispectra; bispectral estimators; frequency smoothed biperiodograms; higher order statistics; multitaper estimators; small dynamical range; total bispectral window; variance properties; white Gaussian process; Fourier transforms; Frequency estimation; Gaussian processes; Multidimensional systems; Physics; Testing;
Conference_Titel :
Higher-Order Statistics, 1999. Proceedings of the IEEE Signal Processing Workshop on
Conference_Location :
Caesarea
Print_ISBN :
0-7695-0140-0
DOI :
10.1109/HOST.1999.778727