DocumentCode
2975868
Title
Modeling and analyzing safety-critical parallel-series system safety
Author
Sun, Qing ; Cui, Lirong ; Pan, Rong
Author_Institution
Sch. of Manage. & Econ., Beijing Inst. of Technol., Beijing, China
fYear
2009
fDate
8-11 Dec. 2009
Firstpage
2463
Lastpage
2467
Abstract
There are working, and two failures states including fail-safe and fail-dangerous in safety-critical systems. This paper studies two different safety-critical parallel-series models by considering their components lifetime distribution possessing general forms. The indices of reliability and safety including the probabilities that the system in these states and mean time for the system under two different failure ways, are derived respectively. Various corresponding indices comparisons between the two different parallel-series system models, and among the series, parallel and parallel-series systems, are conducted. Finally some illustrative numerical examples are employed to show the procedures. The derived indices formulas are without component lifetime distribution assumptions, which have significant meanings for reliability analysis and safety design of the system.
Keywords
reliability theory; safety-critical software; component lifetime distribution; corresponding indices comparisons; derived indices formulas; fail dangerous; fail safe; lifetime distribution possessing; reliability analysis; safety critical parallel series system analysis; safety critical parallel series system modeling; safety design system; Engineering management; Failure analysis; Humans; Power generation economics; Reliability theory; Safety; Software reliability; Software testing; Technology management; Time measurement; Safety-critical system; fail-dangerous; fail-safe; mean time; parallel-series system;
fLanguage
English
Publisher
ieee
Conference_Titel
Industrial Engineering and Engineering Management, 2009. IEEM 2009. IEEE International Conference on
Conference_Location
Hong Kong
Print_ISBN
978-1-4244-4869-2
Electronic_ISBN
978-1-4244-4870-8
Type
conf
DOI
10.1109/IEEM.2009.5373517
Filename
5373517
Link To Document