• DocumentCode
    2975868
  • Title

    Modeling and analyzing safety-critical parallel-series system safety

  • Author

    Sun, Qing ; Cui, Lirong ; Pan, Rong

  • Author_Institution
    Sch. of Manage. & Econ., Beijing Inst. of Technol., Beijing, China
  • fYear
    2009
  • fDate
    8-11 Dec. 2009
  • Firstpage
    2463
  • Lastpage
    2467
  • Abstract
    There are working, and two failures states including fail-safe and fail-dangerous in safety-critical systems. This paper studies two different safety-critical parallel-series models by considering their components lifetime distribution possessing general forms. The indices of reliability and safety including the probabilities that the system in these states and mean time for the system under two different failure ways, are derived respectively. Various corresponding indices comparisons between the two different parallel-series system models, and among the series, parallel and parallel-series systems, are conducted. Finally some illustrative numerical examples are employed to show the procedures. The derived indices formulas are without component lifetime distribution assumptions, which have significant meanings for reliability analysis and safety design of the system.
  • Keywords
    reliability theory; safety-critical software; component lifetime distribution; corresponding indices comparisons; derived indices formulas; fail dangerous; fail safe; lifetime distribution possessing; reliability analysis; safety critical parallel series system analysis; safety critical parallel series system modeling; safety design system; Engineering management; Failure analysis; Humans; Power generation economics; Reliability theory; Safety; Software reliability; Software testing; Technology management; Time measurement; Safety-critical system; fail-dangerous; fail-safe; mean time; parallel-series system;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Engineering and Engineering Management, 2009. IEEM 2009. IEEE International Conference on
  • Conference_Location
    Hong Kong
  • Print_ISBN
    978-1-4244-4869-2
  • Electronic_ISBN
    978-1-4244-4870-8
  • Type

    conf

  • DOI
    10.1109/IEEM.2009.5373517
  • Filename
    5373517