Title :
The statistical performance of double sampling X̃ control charts for correlation data
Author :
Lee, Pei-Hsi ; Torng, Chau-Chen ; Liao, Huang-Sheng ; Tseng, Chun-Chieh
Author_Institution :
Dept. of Bus. Adm., Cheng-Shiu Univ., Cheng-Shiu, Taiwan
Abstract :
Double sampling X control chart (DS) which is a Shewhart-type chart can reduce sample size and detect small process shift fast. In real industries, process observations may be interdependent and correlated, and the statistical performance of DS X chart for the correlated data need to be re-evaluated. This article constructs the calculations of statistical indices of DS X charts for correlation data and performs a comparative study for investigating the performance distinction of DS X charts and other Shewhart-type charts. This comparative study indicates that DS X charts are the best choice for monitoring of correlated data.
Keywords :
control charts; sampling methods; Shewhart-type chart; control charts; correlation data; double sampling; statistical indices; Control charts; Costs; Design optimization; Gaussian distribution; Integrated circuit measurements; Monitoring; Process control; Sampling methods; Semiconductor device measurement; Variable structure systems; correlated data; double sampling X̃ control chart; variable parameters X̃ charts;
Conference_Titel :
Industrial Engineering and Engineering Management, 2009. IEEM 2009. IEEE International Conference on
Conference_Location :
Hong Kong
Print_ISBN :
978-1-4244-4869-2
Electronic_ISBN :
978-1-4244-4870-8
DOI :
10.1109/IEEM.2009.5373536
