• DocumentCode
    2976464
  • Title

    Achieving linear scaling with interference alignment

  • Author

    Özgür, Ayfer ; Tse, David

  • Author_Institution
    Fac. Inf. et Commun., Ecole Polytech. Fed. de Lausanne, Lausanne, Switzerland
  • fYear
    2009
  • fDate
    June 28 2009-July 3 2009
  • Firstpage
    1754
  • Lastpage
    1758
  • Abstract
    Recent results have shown that interference alignment can achieve K/2 degrees of freedom in a K-user interference channel with time or frequency varying channel coefficients. For fixed number of users K, the number of degrees of freedom characterizes the asymptotic behavior of the performance in the high SNR limit but it does not answer the question of how the performance scales with K for any fixed SNR. In particular, it is unclear if a constant rate per user can be maintained as more users enter into the system. In this paper, we investigate the performance of the interference alignment scheme proposed in for fixed SNR. We assume that the channel coefficients between the users are of the form r ejthetas where r is fixed over the duration of communication and thetas is a fast fading phase. We show that for any value of the SNR and K, the aggregate rate achieved by the interference alignment scheme of is lower bounded by c1K log(1 + c2 SNR) where c1 and c2 are positive constants independent of both SNR and K. This result establishes the linear scaling of the interference alignment scheme for the considered random phase channel model.
  • Keywords
    fading channels; radiofrequency interference; time-varying channels; K-user interference channel; asymptotic behavior; fading channel; frequency varying channel; interference alignment scheme; linear scaling property; random phase channel model; time varying channel; Aggregates; Costs; Fading; Frequency; H infinity control; Interference channels; MIMO; Signal design; Transmitters; Wireless networks;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Information Theory, 2009. ISIT 2009. IEEE International Symposium on
  • Conference_Location
    Seoul
  • Print_ISBN
    978-1-4244-4312-3
  • Electronic_ISBN
    978-1-4244-4313-0
  • Type

    conf

  • DOI
    10.1109/ISIT.2009.5205265
  • Filename
    5205265