• DocumentCode
    2976719
  • Title

    GaN/AlN Axial Multi Quantum Well Nanowires for Optoelectronic Devices

  • Author

    Conesa-Boj, S. ; Arbiol, J. ; Furtmayr, F. ; Stark, C. ; Schäfer, S. ; Stutzmann, M. ; Eickhoff, M. ; Peiró, F. ; Morante, J.R.

  • Author_Institution
    Dept. d´´Electron., Univ. de Barcelona, Barcelona
  • fYear
    2009
  • fDate
    11-13 Feb. 2009
  • Firstpage
    61
  • Lastpage
    64
  • Abstract
    III-nitride based quantum wells (QWs) have been extensively studied as active buildings blocks for different electronic and optoelectronic devices. Several samples of GaN/AlN axial multi quantum well nanowires (MQW NWs) have been synthesized, leading to NWs with a MQW structure with GaN wells of different widths along the growth axis, 1.5, 2, 3 and 4 nm. In this work structural and optical properties are studied by means of high resolution transmission electron microscopy (HRTEM) and photoluminescence (PL) analysis respectively.
  • Keywords
    III-V semiconductors; aluminium compounds; gallium compounds; molecular beam epitaxial growth; nanowires; optical materials; optoelectronic devices; photoluminescence; quantum well devices; semiconductor growth; semiconductor quantum wells; transmission electron microscopy; wide band gap semiconductors; GaN-AlN; HRTEM; MQW structure; axial multiquantum well nanowires; high-resolution transmission electron microscopy; optoelectronic devices; photoluminescence analysis; plasma-assisted molecular beam epitaxy; size 1.5 nm; size 2 nm; size 3 nm; size 4 nm; structural properties; Gallium nitride; Nanowires; Optical microscopy; Optical superlattices; Optoelectronic devices; Plasma temperature; Quantum well devices; Stimulated emission; Substrates; Transmission electron microscopy;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices, 2009. CDE 2009. Spanish Conference on
  • Conference_Location
    Santiago de Compostela
  • Print_ISBN
    978-1-4244-2838-0
  • Electronic_ISBN
    978-1-4244-2839-7
  • Type

    conf

  • DOI
    10.1109/SCED.2009.4800430
  • Filename
    4800430