DocumentCode :
2976888
Title :
Investigation of spurious resonances in thin film bulk acoustic wave resonators
Author :
Reinhardt, Alexandre ; Laude, Vincent ; Solal, Marc ; Ballandras, Sylvain ; Steichen, William
Author_Institution :
Dept. LPMO, Inst. FEMTO-ST, Besancon, France
Volume :
3
fYear :
2004
fDate :
23-27 Aug. 2004
Firstpage :
1698
Abstract :
A finite element analysis is performed to simulate thin film bulk acoustic wave (FBAR) structures, and a coupled finite element analysis/boundary integral method (FEA/BIM) is used to simulate accurately a radiation medium, like a Bragg mirror underneath a resonator, without having to mesh it entirely. Displacement fields are extracted from these calculations and analysed. In particular, dispersion curves are obtained by a Fourier analysis of these fields and are used to explain phenomena arising at electrode edges, like standing wave resonances under the electrodes or mode conversions.
Keywords :
Fourier analysis; acoustic dispersion; acoustic resonance; acoustic resonators; bulk acoustic wave devices; finite element analysis; thin film devices; Bragg mirror; FBAR structures; FEA; FEM; Fourier analysis; boundary element method; boundary integral method; dispersion curves; displacement fields; finite element analysis; mode conversions; radiation medium; spurious resonances; standing wave resonances; thin film bulk acoustic wave resonators; Acoustic waves; Analytical models; Electrodes; Film bulk acoustic resonators; Finite element methods; Integral equations; Mirrors; Performance analysis; Resonance; Transistors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Ultrasonics Symposium, 2004 IEEE
ISSN :
1051-0117
Print_ISBN :
0-7803-8412-1
Type :
conf
DOI :
10.1109/ULTSYM.2004.1418151
Filename :
1418151
Link To Document :
بازگشت