Title :
Development of an ultra low moisture polymer adhesive for die attach applications
Author :
Nguyen, My N. ; Chien, Irving Y.
Author_Institution :
Johnson Matthey Electron. Inc., San Diego, CA, USA
Abstract :
A new type of die attach material based on a modified olefin thermoset polymer has been developed. Due to its hydrophobic molecular structure, moisture absorption is inherently very low. For example, it absorbs less than 0.05% moisture at 85°C/85% RH/168 hrs. Even in HAST test (150°C/85% RH/168 hrs.), moisture content is only 0.1%. The olefinic polymer is formulated as a low stress, electrical and thermally conducting paste adhesive. Its other principal features include good processability, less resin bleed and low temperature cure. The new die attach candidates were evaluated using 208 LD PQFP packages with standard epoxy molding compounds. This type of package passed moisture reliability tests at level 3. At JEDEC level 1, there were still package cracks and delaminations at the mold compound interfaces. However, no die attach delamination was observed. These studies clearly demonstrated the need for replacing conventional epoxies with low moisture absorbing polymers for die attachment and encapsulation in order to produce moisture insensitive packages. In summary, the new olefinic thermoset adhesives have shown promise for many die attach applications. These materials will provide important process and reliability improvement for advanced device packaging
Keywords :
adhesion; conducting polymers; cracks; delamination; encapsulation; environmental testing; integrated circuit packaging; integrated circuit reliability; microassembling; moisture; polymer films; JEDEC tests; PQFP packages; delaminations; die attach applications; electrical conducting paste adhesive; encapsulation; hydrophobic molecular structure; low stress paste adhesive; low temperature cure; modified olefin thermoset polymer; moisture absorption; moisture insensitive packages; moisture reliability tests; mold compound interfaces; olefinic polymer; package cracks; reliability improvement; thermally conducting paste adhesive; ultra low moisture polymer adhesive; Absorption; Delamination; Microassembly; Moisture; Packaging; Polymers; Resins; Testing; Thermal conductivity; Thermal stresses;
Conference_Titel :
Electronics Manufacturing Technology Symposium, 1997., Twenty-First IEEE/CPMT International
Conference_Location :
Austin, TX
Print_ISBN :
0-7803-3929-0
DOI :
10.1109/IEMT.1997.626925