• DocumentCode
    2977143
  • Title

    MMIC Compatible Wafer-Level Packaging Technology

  • Author

    Chang-Chien, P. ; Zeng, X. ; Tornquist, K. ; Nishimoto, M. ; Battung, M. ; Chung, Y. ; Yang, J. ; Farkas, D. ; Yajima, M. ; Cheung, C. ; Luo, K. ; Eaves, D. ; Lee, J. ; Uyeda, J. ; Duan, D. ; Fordham, O. ; Chung, T. ; Sandhu, R. ; Tsai, R.

  • Author_Institution
    Northrop Grumman Space Technol., Redondo Beach
  • fYear
    2007
  • fDate
    14-18 May 2007
  • Firstpage
    14
  • Lastpage
    17
  • Abstract
    Northrop Grumman Space Technology (NGST) has developed a MMIC compatible, hermetic wafer-level packaging (WLP) technology that is proven to be hermetic, mechanically and electrically robust. This WLP technology is an enabling technology for realizing lightweight, multifunctional and low cost modules for current and future space and military systems. In this paper, data obtained from various packaged MMICs using NGST´s WLP technology is presented. Furthermore, RF front-end modules with integrated antenna are also demonstrated. NGST´s WLP technology enables true three-dimensional circuit integration by allowing intimate multi-function integration among various MMIC technologies and offers significant size and weight advantages to future high performance RF systems.
  • Keywords
    MMIC; hermetic seals; wafer level packaging; MMIC compatible wafer-level packaging; NGST; Northrop Grumman Space Technology; RF front-end modules; hermetic packaging; integrated antenna; lightweight multifunctional integration; three-dimensional circuit integration; Costs; Electronics packaging; Fabrication; Integrated circuit technology; MMICs; Radio frequency; Space technology; Temperature; Wafer bonding; Wafer scale integration; Bonding; Heterogeneous Integration; MMIC Packaging; Wafer Scale Assembly; Wafer-Level Packaging;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Indium Phosphide & Related Materials, 2007. IPRM '07. IEEE 19th International Conference on
  • Conference_Location
    Matsue
  • ISSN
    1092-8669
  • Print_ISBN
    1-4244-0875-X
  • Electronic_ISBN
    1092-8669
  • Type

    conf

  • DOI
    10.1109/ICIPRM.2007.380677
  • Filename
    4265867