• DocumentCode
    2977369
  • Title

    Logarithmic Compensated Voltage Reference

  • Author

    Popa, C.

  • Author_Institution
    Fac. of Electron. & Telecommun., Univ. Politeh. of Bucharest, Bucharest
  • fYear
    2009
  • fDate
    11-13 Feb. 2009
  • Firstpage
    215
  • Lastpage
    218
  • Abstract
    Very important stages in applications such as AID and D/A converters, data acquisition systems, memories or smart sensors, voltage reference circuits and theirs temperature behavior are intensively studied in the last decade and many researches have been developed for improving them. The new proposed realization of a CMOS voltage reference uses a gate- source voltage of a MOS transistor working in weak inversion as CTAT voltage generator. The idea is that the negative linear dependent term from VGS (T) expression to be compensated by a complementary term implemented using an OVF (Offset Voltage Follower) block. The new curvature-correction technique proposes the compensation of the nonlinear temperature dependence of the gate-source voltage using an original block, ADA (Asymmetric Differential Amplifier), biased at drain currents with different temperature dependencies.
  • Keywords
    CMOS integrated circuits; MOSFET; compensation; differential amplifiers; operational amplifiers; reference circuits; CMOS voltage reference circuit; CTAT voltage generator; MOS transistor; OVF block; VGS (T) expression; asymmetric differential amplifier; complementary metal oxide semiconductor; gate-source voltage; logarithmic curvature-correction technique; nonlinear temperature dependence compensation; offset voltage follower; CMOS technology; Circuits; Data acquisition; MOS devices; MOSFETs; Photonic band gap; Temperature dependence; Temperature distribution; Temperature sensors; Threshold voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices, 2009. CDE 2009. Spanish Conference on
  • Conference_Location
    Santiago de Compostela
  • Print_ISBN
    978-1-4244-2838-0
  • Electronic_ISBN
    978-1-4244-2839-7
  • Type

    conf

  • DOI
    10.1109/SCED.2009.4800469
  • Filename
    4800469