DocumentCode :
2977757
Title :
In-service life consumption estimation in power modules
Author :
Musallam, Mahera ; Johnson, C. Mark ; Yin, Chunyan ; Lu, Hua ; Bailey, Chris
Author_Institution :
Sch. of Electr. & Electron. Eng., Univ. of Nottingham, Nottingham
fYear :
2008
fDate :
1-3 Sept. 2008
Firstpage :
76
Lastpage :
83
Abstract :
Health management and reliability form a fundamental part of the design and development cycle of electronic products. In this paper compact real-time thermal models are used to predict temperatures of inaccessible locations within the power module. These models are then combined with physics of failure based reliability analysis to provide in-service predictions of crack propagation in solder layers and at the bond wire joints as a result of thermal cycling. The temperature estimates are combined with lifetime based reliability models to provide a tool for life consumption monitoring. Rainflow counting algorithms are applied to the temperature vs. time data to extract the occurrence frequencies of different thermal cycling ranges. Knowledge of the life consumed for each different cycle then allows the remaining life time to be estimated under arbitrary operational conditions. The technique can be employed to provide functions such as life consumption monitoring and prognostic maintenance scheduling.
Keywords :
PWM power convertors; bridge circuits; cracks; failure analysis; insulated gate bipolar transistors; lead bonding; life testing; power semiconductor devices; semiconductor device reliability; solders; thermal management (packaging); IGBT module; bond wire joint; crack propagation; electronic products; failure-based reliability analysis; health management; in-service life consumption estimation; inductively-loaded PWM full bridge converter; power module; prognostic maintenance scheduling; rainflow counting algorithm; real-time thermal model; solder layers; thermal cycling; Bonding; Condition monitoring; Failure analysis; Life estimation; Lifetime estimation; Multichip modules; Physics; Predictive models; Temperature; Wire; IGBT; Modelling; Prognosis; Pulse Width Modulation (PWM) Thermal stress; Reliability;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Power Electronics and Motion Control Conference, 2008. EPE-PEMC 2008. 13th
Conference_Location :
Poznan
Print_ISBN :
978-1-4244-1741-4
Electronic_ISBN :
978-1-4244-1742-1
Type :
conf
DOI :
10.1109/EPEPEMC.2008.4635247
Filename :
4635247
Link To Document :
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