DocumentCode
2977994
Title
Fabrication of SAW devices using SEM-based electron beam lithography and lift-off technique for lab use
Author
Hatakeyama, Hisashi ; Omori, Tatsuya ; Hashimoto, Ken-Ya ; Yamayuchi, M.
Author_Institution
Graduate Sch. of Natural Sci. & Technol., Chiba Univ., Japan
Volume
3
fYear
2004
fDate
23-27 Aug. 2004
Firstpage
1896
Abstract
This paper describes a micro-fabrication process developed for daily research work on SAW devices in the authors´ laboratory. The combination of SEM-based electron-beam (EB) lithography and lift-off process installed in a conventional laboratory without any particular cleaning facility is shown to be effective in fabricating well-defined IDT finger patterns with the line width of up to 180 nm in a half day at good yield. For the combination of the EB lithography and lift-off process, it is also shown how a very thin organic anti-static layer works well to avoid charge accumulation on a resist layer, which is easy to occur on insulating piezoelectric substrates and results in the EB diffraction. The present process was applied to the fabrication of SAW devices with various configurations including SHF resonators and single-phase unidirectional transducers. The result concludes how the process is useful for SAW research work in laboratories.
Keywords
electron beam lithography; interdigital transducers; scanning electron microscopy; surface acoustic wave devices; IDT finger patterns; SAW device fabrication; SEM-based electron beam lithography; SHF resonators; insulating piezoelectric substrates; laboratory research; lift-off technique; micro-fabrication process; resist layer; single-phase unidirectional transducers; Cleaning; Diffraction; Electron beams; Fabrication; Fingers; Insulation; Lithography; Piezoelectric transducers; Resists; Surface acoustic wave devices;
fLanguage
English
Publisher
ieee
Conference_Titel
Ultrasonics Symposium, 2004 IEEE
ISSN
1051-0117
Print_ISBN
0-7803-8412-1
Type
conf
DOI
10.1109/ULTSYM.2004.1418201
Filename
1418201
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