• DocumentCode
    2978027
  • Title

    Recombination and diffusion processes in an ICP investigated by the power interruption technique

  • Author

    De Regt, J.M. ; Jonkers, J. ; Van der Mullen, J.A.M.

  • Author_Institution
    Dept. of Phys., Eindhoven Univ. of Technol., Netherlands
  • fYear
    1996
  • fDate
    3-5 June 1996
  • Firstpage
    157
  • Abstract
    Summary form only given. Inductively coupled plasmas (ICP) are widely used for spectrochemical analysis and might be efficient light sources of the future. Knowledge on the properties of these type of plasmas car improve their applicability. For this aim, fundamental research is carried out on the diffusion and recombination processes in an argon ICP by studying the electron density and temperature behavior during power interruption.
  • Keywords
    argon; Ar; ICP; diffusion; electron density; electron temperature; inductively coupled plasmas; light sources; power interruption technique; recombination; spectrochemical analysis; Argon; Diffusion processes; Electrons; Light sources; Optical coupling; Plasma density; Plasma properties; Plasma sources; Plasma temperature; Spontaneous emission;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Plasma Science, 1996. IEEE Conference Record - Abstracts., 1996 IEEE International Conference on
  • Conference_Location
    Boston, MA, USA
  • ISSN
    0730-9244
  • Print_ISBN
    0-7803-3322-5
  • Type

    conf

  • DOI
    10.1109/PLASMA.1996.550685
  • Filename
    550685