DocumentCode :
2978072
Title :
N2-Based ICP-RIE Etching for InP-Based Photonic Crystal Membranes
Author :
Lee, K.-H. ; Guilet, S. ; Sagnes, I. ; Talneau, A.
Author_Institution :
CNRS, Marcoussis
fYear :
2007
fDate :
14-18 May 2007
Firstpage :
222
Lastpage :
225
Abstract :
Adding N2 into Cl2-based plasma discharges during the etching of InP-based photonic crystal in ICP-RIE system is shown to produce smooth sidewalls through the passivation of the etched surfaces. Here we present that the addition of BCI3 into this discharge allows to produce smooth and also vertical profiles in InP-based PhC structures. Positive ion current densities have been measured to characterize the plasma, and provide a perspective to understand the etching mechanism. An one missing row (Wl) photonic crystal membrane-waveguide fabricated by CI2/N2/BCI3 gas mixture exhibits a low propagation losses value of 35 dB/cm while operating below the light line.
Keywords :
current density; membranes; photonic crystals; sputter etching; waveguides; CI2-N2-BCI3; Cl2-based plasma discharges; ICP-RIE etching; InP; InP-based photonic crystal membranes; inductively coupled plasma reactive-ion etching; positive ion current density; waveguide fabrication; Biomembranes; Current density; Current measurement; Density measurement; Etching; Passivation; Photonic crystals; Plasma applications; Plasma measurements; Surface discharges;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Indium Phosphide & Related Materials, 2007. IPRM '07. IEEE 19th International Conference on
Conference_Location :
Matsue
ISSN :
1092-8669
Print_ISBN :
1-4244-0875-X
Electronic_ISBN :
1092-8669
Type :
conf
DOI :
10.1109/ICIPRM.2007.381163
Filename :
4265920
Link To Document :
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