Title :
Effects of Single Impurity Scattering on One-Dimensional Quantum-Effect Devices
Author :
Eugster, C.C. ; del Alamo, Jesus A. ; Melloch, M.R. ; Rooks, M.J.
Author_Institution :
Purdue University
Keywords :
Boolean functions; Circuits; Data structures; Degradation; Electrons; Impurities; Particle scattering; Robustness; Split gate flash memory cells; Tunneling;
Conference_Titel :
Device Research Conference, 1992. Digest. 50th Annual
Conference_Location :
Cambridge, MA, USA
DOI :
10.1109/DRC.1992.671859
