• DocumentCode
    2978080
  • Title

    Effects of Single Impurity Scattering on One-Dimensional Quantum-Effect Devices

  • Author

    Eugster, C.C. ; del Alamo, Jesus A. ; Melloch, M.R. ; Rooks, M.J.

  • Author_Institution
    Purdue University
  • fYear
    1992
  • fDate
    21-24 June 1992
  • Keywords
    Boolean functions; Circuits; Data structures; Degradation; Electrons; Impurities; Particle scattering; Robustness; Split gate flash memory cells; Tunneling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Device Research Conference, 1992. Digest. 50th Annual
  • Conference_Location
    Cambridge, MA, USA
  • Type

    conf

  • DOI
    10.1109/DRC.1992.671859
  • Filename
    671859