DocumentCode :
2978164
Title :
The analysis and measurement of frequency selective surfaces
Author :
Davidson, DB ; Smith, AG ; Van Tonder, JJ
Author_Institution :
Dept. of Electr. & Electron. Eng., Stellenbosch Univ., South Africa
Volume :
2
fYear :
1996
fDate :
24-27 Sep 1996
Firstpage :
724
Abstract :
This paper discusses recent progress on the analysis and measurement of frequency selective surfaces (FSS). The finite difference time domain (FDTD) method is used for the analysis of the structures and measurements are made in a free-space system using a focused Gaussian beam. The extensions required for extending the FDTD method to analyzing periodic structures are reviewed. Computed and measured results are presented and compared for a variety of cases, including both normal and off-normal incidence. Good agreement has been obtained. Parametric studies are reported. Some problems encountered are discussed
Keywords :
antenna testing; finite difference time-domain analysis; frequency selective surfaces; radomes; reflector antennas; FDTD method; FSS; dual frequency reflector antenna systems; finite difference time domain; focused Gaussian beam; free-space system; frequency selective surfaces analysis; frequency selective surfaces measurement; measured results; normal incidence; off-normal incidence; parametric studies; periodic structures; radomes; subreflectors; Africa; Boundary conditions; Computational modeling; Dielectrics; Electromagnetic measurements; Finite difference methods; Frequency measurement; Frequency selective surfaces; Parametric study; Time domain analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
AFRICON, 1996., IEEE AFRICON 4th
Conference_Location :
Stellenbosch
Print_ISBN :
0-7803-3019-6
Type :
conf
DOI :
10.1109/AFRCON.1996.562979
Filename :
562979
Link To Document :
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