• DocumentCode
    2978164
  • Title

    The analysis and measurement of frequency selective surfaces

  • Author

    Davidson, DB ; Smith, AG ; Van Tonder, JJ

  • Author_Institution
    Dept. of Electr. & Electron. Eng., Stellenbosch Univ., South Africa
  • Volume
    2
  • fYear
    1996
  • fDate
    24-27 Sep 1996
  • Firstpage
    724
  • Abstract
    This paper discusses recent progress on the analysis and measurement of frequency selective surfaces (FSS). The finite difference time domain (FDTD) method is used for the analysis of the structures and measurements are made in a free-space system using a focused Gaussian beam. The extensions required for extending the FDTD method to analyzing periodic structures are reviewed. Computed and measured results are presented and compared for a variety of cases, including both normal and off-normal incidence. Good agreement has been obtained. Parametric studies are reported. Some problems encountered are discussed
  • Keywords
    antenna testing; finite difference time-domain analysis; frequency selective surfaces; radomes; reflector antennas; FDTD method; FSS; dual frequency reflector antenna systems; finite difference time domain; focused Gaussian beam; free-space system; frequency selective surfaces analysis; frequency selective surfaces measurement; measured results; normal incidence; off-normal incidence; parametric studies; periodic structures; radomes; subreflectors; Africa; Boundary conditions; Computational modeling; Dielectrics; Electromagnetic measurements; Finite difference methods; Frequency measurement; Frequency selective surfaces; Parametric study; Time domain analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    AFRICON, 1996., IEEE AFRICON 4th
  • Conference_Location
    Stellenbosch
  • Print_ISBN
    0-7803-3019-6
  • Type

    conf

  • DOI
    10.1109/AFRCON.1996.562979
  • Filename
    562979