Title :
Photonic band measurement by angle-resolved spectroscopy and polarimetry
Author :
Král, Zdenek ; Ferré-Borrull, Josep ; Marsal, Lluis F. ; Pallarès, Josep ; Garcia-Caurel, Enric ; Foldyna, Martin ; Olaizola, Santiago M.
Author_Institution :
Nanoelectronic & Photonic Syst., Univ. Rovira i Virgili, Tarragona
Abstract :
In this work we show the application of the angle-resolved spectroscopic reflectivity and polarimetry to the characterization of 2D photonic crystal structures in the form of slabs. The method we introduce is based on the combination of (i) the numerical simulation of the interaction of the incident light with the photonic crystal, (ii) the experimental measurement and (iii) the comparison of both results. We show that the calculations predict the coupling of the incident light to photonic modes propagating inside the structure, related to the photonic bands of the infinite photonic crystal. We demonstrate this coupling in the experimental measurements for two kinds of samples consisting of 2D photonic crystal slabs of micro- and nanostructured photoresist on a silicon substrate.
Keywords :
photonic band gap; photonic crystals; photoresists; polarimetry; reflectivity; slabs; 2D photonic crystal slabs; 2D photonic crystal structures; angle-resolved spectroscopic reflectivity; incident light interaction; numerical simulation; photonic bands; photonic modes; photoresist; polarimetry; Goniometers; Numerical simulation; Optical coupling; Optical propagation; Photonic crystals; Polarimetry; Reflectivity; Resists; Slabs; Spectroscopy;
Conference_Titel :
Electron Devices, 2009. CDE 2009. Spanish Conference on
Conference_Location :
Santiago de Compostela
Print_ISBN :
978-1-4244-2838-0
Electronic_ISBN :
978-1-4244-2839-7
DOI :
10.1109/SCED.2009.4800516