Title :
Approximate semi-Markov chain reliability models
Author :
Wereley, Norman M. ; Walker, Bruce K.
Author_Institution :
Dept. of Aeronaut. & Astronaut., MIT, Cambridge, MA, USA
Abstract :
A property observed in high-reliability fault-tolerant control systems is the relatively rare occurrence of component failures compared to the frequent occurrence of redundancy-management decision events. This property leads to a temporal decomposition of the semi-Markov chain reliability model into two time scales: a slow time scale for failure events and a fast time scale for FDI (failure detection and isolation) events. Conditions are described under which a perturbed semi-Markov chain can be approximated by an enlarged Markov process, the parameters of which derive from the parameters of the semi-Markov chain. Two simple semi-Markov reliability models of a single-component monitoring system are examined
Keywords :
Markov processes; failure analysis; reliability theory; component failures; failure detection and isolation; fast time scale; fault-tolerant control systems; reliability theory; semiMarkov chain reliability models; single component monitoring; slow time scale; Aerospace engineering; Fault detection; Fault tolerant systems; Logic; Mechanical factors; Power system reliability; Read-write memory; Reliability engineering; Space technology; Technology management;
Conference_Titel :
Decision and Control, 1988., Proceedings of the 27th IEEE Conference on
Conference_Location :
Austin, TX
DOI :
10.1109/CDC.1988.194750
