DocumentCode
2978893
Title
Kirk Effect in Type-II InP/GaAsSb DHBTs with a Collector Doping Spike
Author
Liu, H.G. ; Zeng, Y.P. ; Ostinelli, O. ; Bolognesi, C.R.
Author_Institution
Swiss Fed. Inst. of Technol., Zurich
fYear
2007
fDate
14-18 May 2007
Firstpage
409
Lastpage
412
Abstract
The Kirk effect in type-II InP/GaAsSb DHBTs with spike-doped collectors is studied experimentally and theoretically. Accurate two-dimensional hydrodynamic (2D-HD) physical device simulations show that the Kirk threshold current in type-II DHBTs depends on negative conduction band offset (DeltaEC) and is a function of the doping spike position in the InP collector. The optimal collector design can significantly increase the Kirk current limit and the peak fT, without significantly reducing BVCEO.
Keywords
heterojunction bipolar transistors; semiconductor doping; 2D-HD; DHBT; Kirk effect; collector doping spike; heterojunction bipolar transistors; optimal collector design; two-dimensional hydrodynamic physical device simulations; Conference proceedings; Current density; Density measurement; Doping; Double heterojunction bipolar transistors; High definition video; Hydrodynamics; Indium phosphide; Kirk field collapse effect; Laboratories;
fLanguage
English
Publisher
ieee
Conference_Titel
Indium Phosphide & Related Materials, 2007. IPRM '07. IEEE 19th International Conference on
Conference_Location
Matsue
ISSN
1092-8669
Print_ISBN
1-4244-0875-X
Electronic_ISBN
1092-8669
Type
conf
DOI
10.1109/ICIPRM.2007.381211
Filename
4265968
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