DocumentCode :
2978971
Title :
A hybrid ASIC and FPGA architecture
Author :
Zuchowski, Paul S. ; Reynolds, Christopher B. ; Grupp, Richard J. ; Davis, Shelly G. ; Cremen, Brendan ; Troxel, Bill
Author_Institution :
IBM Microeletronics Div., Essex Junction, VT, USA
fYear :
2002
fDate :
10-14 Nov. 2002
Firstpage :
187
Lastpage :
194
Abstract :
This paper introduces a new hybrid ASIC/FPGA chip architecture that is being developed in collaboration between IBM and Xilinx, and highlights some of the design challenges this offers for designers and CAD developers. We review recent data from both the ASIC and FPGA industries, including technology features, and trends in usage and costs. This background data indicates that there are advantages to using standard ASICs and FPGAs for many applications, but technical and financial considerations are increasingly driving the need for a hybrid ASIC/FPGA architecture at specific volume tiers and technology nodes. As we describe the hybrid chip architecture ,we point out evolving tool and methodology issues that will need to be addressed to enable customers to effectively design hybrid ASIC/FPGAs. The discussion highlights specific automation issues in the areas of logic partitioning, logic simulation, verification, timing, layout and test.
Keywords :
application specific integrated circuits; circuit CAD; circuit simulation; field programmable gate arrays; formal verification; hybrid integrated circuits; integrated circuit design; integrated circuit economics; integrated circuit modelling; integrated circuit testing; logic CAD; logic partitioning; logic simulation; logic testing; timing; ASIC/FPGA industries technology features/usage/cost trends; CAD tools; IC test; circuit layout; design methodology issues; hybrid ASIC/FPGA chip architecture; logic partitioning; logic simulation; technology nodes; timing; verification; volume tiers; Application specific integrated circuits; Collaboration; Digital signal processing; Field programmable gate arrays; Firewire; Flexible printed circuits; Logic design; Logic devices; Logic testing; Microelectronics;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer Aided Design, 2002. ICCAD 2002. IEEE/ACM International Conference on
ISSN :
1092-3152
Print_ISBN :
0-7803-7607-2
Type :
conf
DOI :
10.1109/ICCAD.2002.1167533
Filename :
1167533
Link To Document :
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