Title :
Managing power and performance for system-on-chip designs using Voltage Islands
Author :
Lackey, David E. ; Zuchowski, P.S. ; Bednar, Thomas R. ; Stout, Douglas W. ; Gould, Scott W. ; Cohn, J.M.
Author_Institution :
IBM Microelectron. Div., Essex Junction, VT, USA
Abstract :
This paper discusses Voltage Islands, a system architecture and chip implementation methodology, that can be used to dramatically reduce active and static power consumption for System-on-Chip (SoC) designs. As technology scales for increased circuit density and performance, the need to reduce power consumption increases in significance as designers strive to utilize the advancing silicon capabilities. The consumer product market further drives the need to minimize chip power consumption. Effective use of Voltage Islands for meeting SoC power and performance requirements, while meeting Time to Market (TAT) demands, requires novel approaches throughout the design flow as well as special circuit components and chip powering structures. This paper outlines methods being used today to design Voltage Islands in a rapid-TAT product development environment, and discusses the need for industry EDA advances to create an industry-wide Voltage Island design capability.
Keywords :
design for testability; electronic design automation; integrated circuit design; logic simulation; low-power electronics; system-on-chip; timing; SoC designs; SoC performance requirements; SoC power requirements; Voltage Islands methodology; active power consumption; chip implementation methodology; industry EDA advances; industry-wide Voltage Island design capability; power consumption reduction; rapid-TAT product development environment; static power consumption; system architecture methodology; system-on-chip designs; time to market demands; Circuits; Consumer products; Energy consumption; Energy management; Power system management; Product development; Silicon; System-on-a-chip; Time to market; Voltage;
Conference_Titel :
Computer Aided Design, 2002. ICCAD 2002. IEEE/ACM International Conference on
Print_ISBN :
0-7803-7607-2
DOI :
10.1109/ICCAD.2002.1167534