DocumentCode :
2979021
Title :
INDUCTWISE: inductance-wise interconnect simulator and extractor
Author :
Chen, Tsung-Hao ; Luk, Clement ; Kim, Hyungsuk ; Chen, Charlie Chung-Ping
Author_Institution :
Dept. of Electr. & Comput. Eng., Wisconsin Univ., Madison, WI, USA
fYear :
2002
fDate :
10-14 Nov. 2002
Firstpage :
215
Lastpage :
220
Abstract :
We have developed a robust, efficient, and accurate tool, which integrates inductance extraction and simulation, called INDUCTWISE. This paper advances the state-of-the-art inductance extraction and simulation techniques and contains two major parts. In the first part, INDUCTWISE extractor, we discovered that the recently proposed inductance matrix sparsification algorithm, the K-method, albeit its great benefit of efficiency, has a major flaw in the stability. We provide both a counter example and a remedy for it. A window section algorithm is also presented to preserve the accuracy of the sparsification method. The second part, the INDUCTWISE simulator, demonstrates great efficiency of integrating the nodal analysis formulation with the improved K-method. Experimental results show that INDUCTWISE has over 250× speedup compared to SPICE3. The proposed sparsification algorithm accelerates the simulator another 175× and speeds up the extractor 23.4× within 0.1% of error. INDUCTWISE can extract and simulate an 118K-conductor RKC circuit within 18 minutes.
Keywords :
VLSI; circuit simulation; inductance; integrated circuit interconnections; sparse matrices; INDUCTWISE; VLSI technology; improved K-method; inductance matrix sparsification algorithm; inductance-wise interconnect extractor; inductance-wise interconnect simulator; nodal analysis formulation; parasitic on-chip inductance; window section algorithm; Circuit simulation; Computational modeling; Coupling circuits; Crosstalk; Frequency; H infinity control; Inductance; Large-scale systems; Power grids; Uncertainty;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer Aided Design, 2002. ICCAD 2002. IEEE/ACM International Conference on
ISSN :
1092-3152
Print_ISBN :
0-7803-7607-2
Type :
conf
DOI :
10.1109/ICCAD.2002.1167537
Filename :
1167537
Link To Document :
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