Title :
Linear Edges Detections Based on Ridgelet Analysis
Author :
Bai, Yunxiao ; Qu, Shiru
Author_Institution :
Sch. of Autom., Northwestern Polytech. Univ., Xi´´an, China
Abstract :
Feature detection is an important point in picture process. The results of its detection will affect pattern recognition and classification directly. Based on Radon transform and wavelet transform detection, linear edges detection method based on Ridgelet transform are put forward in this thesis. With this method, All straight lines are detected and their locations are relatively precise.
Keywords :
Radon transforms; edge detection; feature extraction; wavelet transforms; Radon transform; feature detection; linear edges detections; pattern recognition; ridgelet analysis; ridgelet transform; wavelet transform detection; Feature extraction; Image edge detection; Image segmentation; Wavelet analysis; Wavelet coefficients;
Conference_Titel :
Multimedia Technology (ICMT), 2010 International Conference on
Conference_Location :
Ningbo
Print_ISBN :
978-1-4244-7871-2
DOI :
10.1109/ICMULT.2010.5629867
