DocumentCode :
2979692
Title :
Conflict driven learning in a quantified Boolean satisfiability solver
Author :
Zhang, Lintao ; Malik, Sharad
Author_Institution :
Dept. of Electr. Eng., Princeton Univ., NJ, USA
fYear :
2002
fDate :
10-14 Nov. 2002
Firstpage :
442
Lastpage :
449
Abstract :
Within the verification community, there has been a recent increase in interest in Quantified Boolean Formula evaluation (QBF) as many interesting sequential circuit verification problems can be formulated as QBF instances. A closely related research area to QBF is Boolean Satisfiability (SAT). Recent advances in SAT research have resulted in some very efficient SAT solvers. One of the critical techniques employed in these solvers is Conflict Driven Learning. In this paper, we adapt conflict driven learning for application in a QBF setting. We show that conflict driven learning can be regarded as a resolution process on the clauses. We prove that under certain conditions, tautology clauses obtained from resolution in QBF also obey the rules for implication and conflicts of regular (non-tautology) clauses; and therefore they can be treated as regular clauses and used in future search. We have implemented this idea in a new QBF solver called Quaffle and our initial experiments show that conflict driven learning can greatly speed up the solution process for most of the benchmarks we tested.
Keywords :
Boolean functions; computability; formal verification; learning (artificial intelligence); logic CAD; sequential circuits; Quaffle; SAT solvers; conflict driven learning; long distance resolution; quantified Boolean formula evaluation; quantified Boolean satisfiability solver; regular clauses; sequential circuit verification problems; tautology clauses; Artificial intelligence; Benchmark testing; Binary decision diagrams; Circuit testing; Electronic design automation and methodology; Logic; Sequential circuits;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer Aided Design, 2002. ICCAD 2002. IEEE/ACM International Conference on
ISSN :
1092-3152
Print_ISBN :
0-7803-7607-2
Type :
conf
DOI :
10.1109/ICCAD.2002.1167570
Filename :
1167570
Link To Document :
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