Title : 
Anything more than size in nanoelectronics
         
        
            Author : 
Ni, Wei-Xin ; Shieh, Jia-Min ; Lin, Horng-Chih
         
        
            Author_Institution : 
Nat. Nano Device Lab., Hsinchu
         
        
        
        
        
        
            Abstract : 
In this talk, the author give a survey of this important technical field, and also efforts at National Nano Device Laboratories (NDL) for Si-based devices and architectures that maybe implemented along the roads toward 22 nm-node CMOS and beyond for more and more than Moore. In particular, the author deal with some device solutions using Ge or III-V semiconductors for enhancing performance and functionalities, as well as issues relating to so-called heterogeneous integration of these devices with existing Si chip systems. It is noted that for nano-sized p-MOS, Ge channel might be a good solution, but for n-MOS there are server limits even considering the implementation of some III-V semiconductors as the channel materials. Furthermore, some routes to integrate functional devices for electronic-photonic convergence and bio-electronic applications was also discussed.
         
        
            Keywords : 
CMOS integrated circuits; III-V semiconductors; germanium; integrated optics; nanoelectronics; silicon; CMOS; Ge; III-V semiconductors; Si; bio-electronic; electronic-photonic convergence; heterogeneous integration; n-MOS; nano-sized p-MOS; nanoelectronics; size 22 nm; Consumer electronics; Electronics industry; Fabrication; III-V semiconductor materials; Industrial electronics; Laboratories; Materials science and technology; Nanoelectronics; Physics; Textile industry;
         
        
        
        
            Conference_Titel : 
Electron Devices and Solid-State Circuits, 2007. EDSSC 2007. IEEE Conference on
         
        
            Conference_Location : 
Tainan
         
        
            Print_ISBN : 
978-1-4244-0637-1
         
        
            Electronic_ISBN : 
978-1-4244-0637-1
         
        
        
            DOI : 
10.1109/EDSSC.2007.4450051