A technology-independent CAD tool for ESD protection device extraction-ESDExtractor

Author

Zhan, R.Y. ; Feng, H.G. ; Wu, Q. ; Chen, G. ; Guan, X.K. ; Wang, A.Z.

Author_Institution

Dept. of Electr. & Comput. Eng., Illinois Inst. of Technol., Chicago, IL, USA

fYear

2002

fDate

10-14 Nov. 2002

Firstpage

510

Lastpage

513

Abstract

The challenges for developing an ESD (electrostatic discharge) layout extractor originate from unconventional layout patterns of ESD protection devices, parasitic ESD device extraction and device count reduction. This paper reports a new technology-independent layout extractor, ESDExtractor, which is capable of extracting all types of ESD devices and answers the demands for ESD design verification. A general methodology to extract both intentional and parasitic ESD devices, specific algorithms and implementation methods for efficiency-enhancement are presented, followed by a design example.

Keywords

circuit CAD; electrostatic discharge; integrated circuit design; integrated circuit reliability; protection; ESD design verification; ESD protection device extraction; ESD protection devices; ESDExtractor; device count reduction; efficiency-enhancement; electrostatic discharge layout extractor; implementation methods; intentional ESD devices; layout patterns; parasitic ESD device extraction; parasitic ESD devices; technology-independent CAD tool; Circuit synthesis; Data mining; Databases; Electrostatic discharge; Flowcharts; Integrated circuit layout; MOSFET circuits; Protection; Stress; Thyristors;

fLanguage

English

Publisher

ieee

Conference_Titel

Computer Aided Design, 2002. ICCAD 2002. IEEE/ACM International Conference on

ISSN

1092-3152

Print_ISBN

0-7803-7607-2

Type

conf

DOI

10.1109/ICCAD.2002.1167580

Filename

1167580