Title : 
A technology-independent CAD tool for ESD protection device extraction-ESDExtractor
         
        
            Author : 
Zhan, R.Y. ; Feng, H.G. ; Wu, Q. ; Chen, G. ; Guan, X.K. ; Wang, A.Z.
         
        
            Author_Institution : 
Dept. of Electr. & Comput. Eng., Illinois Inst. of Technol., Chicago, IL, USA
         
        
        
        
        
        
            Abstract : 
The challenges for developing an ESD (electrostatic discharge) layout extractor originate from unconventional layout patterns of ESD protection devices, parasitic ESD device extraction and device count reduction. This paper reports a new technology-independent layout extractor, ESDExtractor, which is capable of extracting all types of ESD devices and answers the demands for ESD design verification. A general methodology to extract both intentional and parasitic ESD devices, specific algorithms and implementation methods for efficiency-enhancement are presented, followed by a design example.
         
        
            Keywords : 
circuit CAD; electrostatic discharge; integrated circuit design; integrated circuit reliability; protection; ESD design verification; ESD protection device extraction; ESD protection devices; ESDExtractor; device count reduction; efficiency-enhancement; electrostatic discharge layout extractor; implementation methods; intentional ESD devices; layout patterns; parasitic ESD device extraction; parasitic ESD devices; technology-independent CAD tool; Circuit synthesis; Data mining; Databases; Electrostatic discharge; Flowcharts; Integrated circuit layout; MOSFET circuits; Protection; Stress; Thyristors;
         
        
        
        
            Conference_Titel : 
Computer Aided Design, 2002. ICCAD 2002. IEEE/ACM International Conference on
         
        
        
            Print_ISBN : 
0-7803-7607-2
         
        
        
            DOI : 
10.1109/ICCAD.2002.1167580