• DocumentCode
    2979953
  • Title

    A simple digital background gain error calibration technique for pipelined ADCs

  • Author

    Moosazadeh, Tohid ; Yavari, Mohammad

  • Author_Institution
    Dept. of Electr. Eng., Amirkabir Univ. of Technol., Tehran, Iran
  • fYear
    2010
  • fDate
    11-13 May 2010
  • Firstpage
    437
  • Lastpage
    441
  • Abstract
    This paper presents a simple digital background calibration technique to eliminate the gain errors of 1.5bit/stage pipelined analog-to-digital converters caused by finite DC gain of stage amplifiers. In this technique, the gain errors are extracted by creating a mismatch between stage sub-ADC threshold voltages in the “split ADC” architecture derived from [1] and [2]. The technique is tested on a prototype 12bit 1.5bit/stage pipelined ADC with maximum 50dB amplifier DC gain. MATLAB and Simulink environment simulations show 19dB SNDR and 45dB SFDR improvements after calibration technique is applied on the first four stages of the ADC, which were limited to 52dB and 55dB before calibration.
  • Keywords
    Analog-digital conversion; Calibration; Capacitors; Error correction; Integrated circuit synthesis; Integrated circuit technology; Laboratories; Prototypes; Testing; Threshold voltage; Digital background calibration; Gain errors; Pipelined ADCs; Split ADC;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Engineering (ICEE), 2010 18th Iranian Conference on
  • Conference_Location
    Isfahan, Iran
  • Print_ISBN
    978-1-4244-6760-0
  • Type

    conf

  • DOI
    10.1109/IRANIANCEE.2010.5507031
  • Filename
    5507031