DocumentCode
2980041
Title
Quenching of impact ionization in heavy ion induced tracks in wide bandwidth Si Avalanche Photodiodes
Author
Laird, Jamie S. ; Onoda, Shinobu ; Hirao, Toshio ; Edmonds, Larry ; Ohshima, Takeshi
Author_Institution
Jet Propulsion Lab. JPL/NASA, California Inst. of Technol., Pasadena, CA, USA
fYear
2007
fDate
10-14 Sept. 2007
Firstpage
1
Lastpage
6
Abstract
High-injection effects on the impulse response and high-frequency gain of a Si Avalanche Photodiode have been observed for a series of MeV heavy ions species with the same track structure but different injection levels. Focused picosecond laser results have also been collected as a function of laser waist. For the ultra-high injection levels present in the ion track, space-charge screening distorts the field profile leading to reduced impact ionization rates. Synopsis TCAD simulations are performed to clarify the role of screening in quenching or enhancing avalanche mechanisms and under what conditions one occurs over the other for an APD.
Keywords
avalanche photodiodes; elemental semiconductors; impact ionisation; ion beam effects; semiconductor technology; silicon; space charge; technology CAD (electronics); transient response; Si; avalanche photodiodes; focused picosecond laser; heavy ion induced tracks; high-frequency gain; high-injection effects; impact ionization quenching; impulse response; laser waist function; space-charge screening distortion; synopsis TCAD simulation; Avalanche photodiodes; Bandwidth; Character generation; Electrons; Impact ionization; Laser noise; Optical coupling; P-i-n diodes; PIN photodiodes; Protons;
fLanguage
English
Publisher
ieee
Conference_Titel
Radiation and Its Effects on Components and Systems, 2007. RADECS 2007. 9th European Conference on
Conference_Location
Deauville
ISSN
0379-6566
Print_ISBN
978-1-4244-1704-9
Type
conf
DOI
10.1109/RADECS.2007.5205467
Filename
5205467
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