Title :
Efficient Transistor Optimization with Stress Enhanced Notch-gate Technology for sub-90nm CMOSFET
Author :
Yeh, W.K. ; Hsu, C.-W. ; Lai, C.M. ; Lin, C.T. ; Fang, Y.K. ; Hsu, C.H. ; Chen, L.W. ; Huang, Y.T. ; Tsai, C.T.
Author_Institution :
Nat. Univ. of Kaohsiung, Kaohsiung
Abstract :
A simple and efficient strained engineering was reported, by implementing a notch-gate into high tensile-stress CESL (contact etch stop layer) process. Low process changes were utilized to modulate channel stress and implant profile for generating enhanced performance without any extra process step needed. Compared to conventional vertical-gate CMOSFET with an additional offset spacer, device with notch-gate as self-aligned offset spacer possess lower parasitic capacitance and shows extra 7% nMOSFET ION enhancement due to stress CESL more approached to channel center region, enhancing channel carrier mobility efficiently. For pMOSFET, even with inappropriate effect by tensile stress, extra 3% ION enhancement due to optimal channel profile by halo implantation through notch-gate structure.
Keywords :
CMOS integrated circuits; stress effects; tensile strength; CMOSFET; channel stress; contact etch stop layer; efficient transistor optimization; implant profile; stress enhanced notch gate technology; tensile stress CESL; CMOS technology; CMOSFETs; Compressive stress; Etching; Implants; MOSFET circuits; Microelectronics; Parasitic capacitance; Research and development; Tensile stress;
Conference_Titel :
Electron Devices and Solid-State Circuits, 2007. EDSSC 2007. IEEE Conference on
Conference_Location :
Tainan
Print_ISBN :
978-1-4244-0637-1
Electronic_ISBN :
978-1-4244-0637-1
DOI :
10.1109/EDSSC.2007.4450063
