DocumentCode
2980251
Title
Ion track structure and dynamics in SiO2
Author
Murat, M. ; Akkerman, A. ; Barak, J.
Author_Institution
Soreq NRC, Yavne, Israel
fYear
2007
fDate
10-14 Sept. 2007
Firstpage
1
Lastpage
9
Abstract
Differential spatiotemporal distributions of the deposited energy around ion tracks in SiO2 are calculated using Monte Carlo simulations with input parameters extracted from the complex dielectric function theory. It is shown that the spatial and temporal dependences cannot be separated. The track evolution and the time to reach a given energy deposition are approximately calculated. The track radius is evaluated from the radial distribution of the deposited energy as a function of ion energy. Formation of a visible track due to lattice damage through ionization (latent track), as well as straggling in energy deposition are discussed.
Keywords
Monte Carlo methods; ion beam effects; ionisation; silicon compounds; Monte Carlo simulations; SiO2; complex dielectric function theory; differential spatiotemporal distributions; energy deposition; ion energy; ion track structure; ion tracks; ionization; lattice damage; radial distribution; Electrons; Insulation life; Laser beams; Laser theory; Mechanical factors; Nuclear electronics; Particle beams; Particle tracking; Ultrafast electronics; Uncertainty; Charge radial distribution; Monte-Carlo simulation; microdose and straggling effects; time evolution of track structure;
fLanguage
English
Publisher
ieee
Conference_Titel
Radiation and Its Effects on Components and Systems, 2007. RADECS 2007. 9th European Conference on
Conference_Location
Deauville
ISSN
0379-6566
Print_ISBN
978-1-4244-1704-9
Type
conf
DOI
10.1109/RADECS.2007.5205478
Filename
5205478
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