DocumentCode :
2980385
Title :
Fabrication of Vertically Aligned Silicon Nanowire Arrays and Investigation on the Formation of the Nickel Silicide Nanowires
Author :
Cheng, S.L. ; Chung, C.H. ; Lee, H.C.
Author_Institution :
Nat. Central Univ., Chungli
fYear :
2007
fDate :
20-22 Dec. 2007
Firstpage :
121
Lastpage :
124
Abstract :
Large-area, vertically aligned silicon nanowire arrays have been successfully fabricated on (001)Si substrates via the redox reactions between silicon and silver ions in the aqueous solution of AgNO3/HF. From SEM and TEM observations, the typical widths of the synthesized SiNWs are in the range of 30-200 nm. The lengths of SiNWs could be tuned from several to tens of micrometers by adjusting the reaction temperatures and time. For the Ni thin films on Si nanowires samples, the growth of epitaxial NiSi2 was found to be more favorable for the samples with smaller nanowire widths. The epitaxial orientation relationship between the NiSi2 and Si nanowires was identified to be [100]NiSi2// [100]Si and (002)NiSi2//(004)Si. The observed results present the exciting prospect that with appropriate controls, this approach could be applied to investigate the phase transformation and growth kinetics of other metal contacts or interconnects on Si substrates at the nanometer-scale.
Keywords :
nanowires; nickel compounds; oxidation; phase transformations; reduction (chemical); scanning electron microscopy; silicon; transmission electron microscopy; NiSi2; SEM; Si; TEM; growth kinetics; nickel silicide nanowires; phase transformation; redox reactions; size 30 nm to 200 nm; vertically aligned silicon nanowire arrays; Fabrication; Hafnium; Kinetic theory; Nickel; Semiconductor thin films; Silicides; Silicon; Silver; Substrates; Temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices and Solid-State Circuits, 2007. EDSSC 2007. IEEE Conference on
Conference_Location :
Tainan
Print_ISBN :
978-1-4244-0637-1
Electronic_ISBN :
978-1-4244-0637-1
Type :
conf
DOI :
10.1109/EDSSC.2007.4450077
Filename :
4450077
Link To Document :
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