Title :
Leakage power modeling and reduction with data retention
Author :
Liao, Weiping ; Basile, Joseph M. ; He, Lei
Author_Institution :
Dept. of Electr. Eng., California Univ., Los Angeles, CA, USA
Abstract :
In this paper, we study leakage power reduction using power gating in the form of the virtual power/ground rails clamp (VRC) and multi-threshold CMOS (MTCMOS) techniques. We apply power gating to two circuit types: memory-based units and datapath components. Using a microarchitecture-level power simulator, as well as power and timing models derived from detailed circuit designs, we further study leakage power modeling and reduction at the system level for modern high-performance VLIW processors. We show that the leakage power can be over 40% of the total power for such processors. Moreover, we propose time-out scheduling of the VRC to reduce power up to 85.65% for an L2 cache. This power saving results in close to 1/3 of the total power dissipation for the VLIW processors we studied.
Keywords :
CMOS digital integrated circuits; cache storage; circuit simulation; integrated circuit design; integrated circuit modelling; leakage currents; logic design; logic simulation; low-power electronics; microprocessor chips; processor scheduling; timing; L2 cache power reduction; MTCMOS; VRC cache scheduling; VRC time-out scheduling; data retention; datapath components; high-performance VLIW processors; memory-based units; microarchitecture-level power simulation; multi-threshold CMOS techniques; power gating; power/timing models; system level leakage power modeling/reduction; total processor power dissipation; virtual power/ground rails clamp; CMOS technology; Circuit simulation; Circuit synthesis; Clamps; Microarchitecture; Power system modeling; Rails; Semiconductor device modeling; Timing; VLIW;
Conference_Titel :
Computer Aided Design, 2002. ICCAD 2002. IEEE/ACM International Conference on
Print_ISBN :
0-7803-7607-2
DOI :
10.1109/ICCAD.2002.1167610