Title :
Impact of hydrogen contamination on the total dose response of linear bipolar microcircuits
Author :
Adell, P.C. ; McClure, S. ; Pease, R.L. ; Rax, B.G. ; Dunham, G.W. ; Barnaby, H.J. ; Chen, X.J.
Author_Institution :
Jet Propulsion Lab., Pasadena, CA, USA
Abstract :
Several linear bipolar microcircuits commonly used in space have been selected to investigate whether hydrogen contamination has an impact on their total dose response. Results obtained from irradiations performed on the HSYE117 linear voltage regulator from Intersil and the AD590 temperature transducer from Analog Devices show a causal relationship between in-package hydrogen content and total dose response. Silicon nitride passivation has been found to play a key role in this study. A recommended approach to hardening bipolar linear circuits with poor total dose response is to characterize them as processed through metallization.
Keywords :
bipolar analogue integrated circuits; metallisation; passivation; voltage control; hydrogen contamination; hydrogen content; linear bipolar microcircuits; linear voltage regulator; metallization; silicon nitride passivation; total dose response; Contamination; Hydrogen; Linear circuits; Metallization; Passivation; Regulators; Silicon; Temperature; Transducers; Voltage; Enhanced low-dose rate sensitivity; hydrogen; linear regulator; passivation; radiation effects; temperature transducer; total ionizing dose;
Conference_Titel :
Radiation and Its Effects on Components and Systems, 2007. RADECS 2007. 9th European Conference on
Conference_Location :
Deauville
Print_ISBN :
978-1-4244-1704-9
DOI :
10.1109/RADECS.2007.5205490
