• DocumentCode
    2980564
  • Title

    Combined dynamic voltage scaling and adaptive body biasing for lower power microprocessors under dynamic workloads

  • Author

    Martin, Steven M. ; Flautner, Krisztian ; Mudge, Trevor ; Blaauw, David

  • Author_Institution
    Dept. of Electr. Eng. & Comput. Sci., Michigan Univ., Ann Arbor, MI, USA
  • fYear
    2002
  • fDate
    10-14 Nov. 2002
  • Firstpage
    721
  • Lastpage
    725
  • Abstract
    Dynamic voltage scaling (DVS) reduces the power consumption of processors when peak performance is unnecessary. However, the achievable power saving by DVS alone is becoming limited as leakage power increases. In this paper, we show how the simultaneous use of adaptive body biasing (ABB) and DVS can be used to reduce power in high-performance processors. Analytical models of the leakage current, dynamic power, and frequency as functions of supply voltage and body bias are derived and verified with SPICE simulation. We then show how to determine the correct trade-off between supply voltage and body bias for a given clock frequency and duration of operation. The usefulness of our approach is evaluated on real workloads obtained using real-time monitoring of processor utilization for four applications. The results demonstrate that application of simultaneous DVS and ABB results in an average energy reduction of 48% over DVS alone.
  • Keywords
    SPICE; circuit optimisation; circuit simulation; integrated circuit design; integrated circuit measurement; integrated circuit modelling; leakage currents; logic design; logic simulation; microprocessor chips; SPICE; adaptive body biasing; dynamic power; dynamic voltage scaling; high-performance processor power consumption reduction; leakage power/current modeling; lower power microprocessors; microprocessors dynamic workloads; optimization; processor clock frequency/supply voltage; processor utilization real-time monitoring; simultaneous DVS/ABB; supply voltage/body bias trade-off; Analytical models; Clocks; Dynamic voltage scaling; Energy consumption; Frequency; Leakage current; Microprocessors; Monitoring; SPICE; Voltage control;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Aided Design, 2002. ICCAD 2002. IEEE/ACM International Conference on
  • ISSN
    1092-3152
  • Print_ISBN
    0-7803-7607-2
  • Type

    conf

  • DOI
    10.1109/ICCAD.2002.1167611
  • Filename
    1167611