Title :
Malleable coding with edit-distance cost
Author :
Varshney, Lav R. ; Kusuma, J. ; Goyal, Vivek K.
Author_Institution :
Res. Lab. of Electron., MIT, Cambridge, MA, USA
fDate :
June 28 2009-July 3 2009
Abstract :
A malleable coding scheme considers not only representation length but also ease of representation update, thereby encouraging some form of recycling to convert an old codeword into a new one. We examine the trade-off between compression efficiency and malleability cost, measured with a string edit distance that introduces a metric topology to the representation domain. We characterize the achievable rates and malleability as the solution of a subgraph isomorphism problem.
Keywords :
isomorphism; source coding; edit-distance cost; malleable coding; string edit distance; subgraph isomorphism problem; Costs; DNA; Decoding; Electrical resistance measurement; Laboratories; Length measurement; Memristors; Recycling; Source coding; Topology;
Conference_Titel :
Information Theory, 2009. ISIT 2009. IEEE International Symposium on
Conference_Location :
Seoul
Print_ISBN :
978-1-4244-4312-3
Electronic_ISBN :
978-1-4244-4313-0
DOI :
10.1109/ISIT.2009.5205494
