DocumentCode :
2980638
Title :
Entropy bounds for a Markov random subfield
Author :
Reyes, Matthew G. ; Neuhoff, David L.
Author_Institution :
EECS Dept., Univ. of Michigan, Ann Arbor, MI, USA
fYear :
2009
fDate :
June 28 2009-July 3 2009
Firstpage :
309
Lastpage :
313
Abstract :
Given a Markov random field (MRF) X defined by potentials on a graph G = (V,E), and given a subset U ¿ V of the sites on which X is defined, we prove, under a positive correlation constraint on the MRF, that the entropy of the subfield XU is upper bounded by the entropy of an MRF defined on the subgraph induced by U with potentials taken directly from those assigned to U in G. To prove this we use exponential family representations of MRFs. We first show that the entropy of an MRF is monotone decreasing in the exponential parameters. We then use the Maximum Entropy principle and a well-known result from information geometry to show that the marginal entropy of XU is upper bounded by the MRF on the induced subgraph with moments matching the marginal distribution. We then use the convexity of the log-partition function to show that to match the marginal moments on the induced subgraph, the exponential coordinates on the induced subgraph are component-wise greater than the corresponding parameter of the original exponential characterization. Our result follows from monotonicity.
Keywords :
Markov processes; graph theory; maximum entropy methods; Markov random subfield; entropy bounds; exponential coordinates; exponential family representations; information geometry; log-partition function; marginal distribution; marginal entropy; maximum entropy principle; moments matching; monotonicity; positive correlation constraint; subgraph; Belief propagation; Entropy; Graphical models; Image coding; Information geometry; Markov random fields; Pixel; Probability distribution; Random variables; Statistical distributions;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Information Theory, 2009. ISIT 2009. IEEE International Symposium on
Conference_Location :
Seoul
Print_ISBN :
978-1-4244-4312-3
Electronic_ISBN :
978-1-4244-4313-0
Type :
conf
DOI :
10.1109/ISIT.2009.5205495
Filename :
5205495
Link To Document :
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