Title :
Total dose radiation effect simulations on a high-precision data acquisition system
Author :
Mikkola, Esko ; Vermeire, Bert ; Chiu, Terence ; Barnaby, Hugh ; Parks, H.G.
Author_Institution :
Electr. & Comput. Eng. Dept., Univ. of Arizona, Tucson, AZ, USA
Abstract :
A novel method to evaluate total dose radiation response on large mixed signal circuits is described. The method is based on partly behavioral, partly structural simulation on the VHDL-AMS language. Results obtained with the developed simulation method are compared to total dose testing results of an embedded high-precision data acquisition system. The system was total dose tested until functional failure in a Cobalt-60 irradiation chamber. Photoemission microscopy (PEM) analysis showed severe TID induced leakage currents inside the 1.2 kbyte SRAM memory sub-system. The SRAM sub-system was TID simulated with the developed method, and the results were compared to the irradiation test results. The simulation results suggest that the drain-to-source leakage currents inside the SRAM sub-system might not be the only cause for the system failure.
Keywords :
SRAM chips; data acquisition; mixed analogue-digital integrated circuits; radiation effects; SRAM sub-system; VHDL-AMS language; data acquisition system; large mixed signal circuits; photoemission microscopy; total dose radiation effect; total ionizing dose; Circuit simulation; Circuit testing; Computational modeling; Data acquisition; Degradation; Leakage current; Radiation effects; Random access memory; System testing; USA Councils; Behavioral Modeling; CMOS; Mixed Signal Circuits; Radiation Effects; Total Ionizing Dose (TID); VHDL-AMS;
Conference_Titel :
Radiation and Its Effects on Components and Systems, 2007. RADECS 2007. 9th European Conference on
Conference_Location :
Deauville
Print_ISBN :
978-1-4244-1704-9
DOI :
10.1109/RADECS.2007.5205496
