• DocumentCode
    2980703
  • Title

    Characterizations of a GaInNAs double-barrier quantum-well infrared photo-detector with the near-infrared photo-detection

  • Author

    Ma, B.S. ; Fan, W.J. ; Dang, Y.X. ; Cheah, W.K. ; Loke, W.K. ; Liu, W. ; Sentosa, D. ; Liu, Y.W. ; Lew, K.L. ; Wang, H. ; Yoon, S.F. ; Zhang, D.H.

  • Author_Institution
    Nanyang Technol. Univ., Singapore
  • fYear
    2007
  • fDate
    20-22 Dec. 2007
  • Firstpage
    193
  • Lastpage
    196
  • Abstract
    A novel GalnNAs/AlAs/AlGaAs double-barrier quantum-well-infrared-photo-detector was characterized by photoluminescence, x-ray diffraction, photoluminescence excitation, photocurrent spectra and dark current measurements. The photoluminescence peak at ~1.2 eV and the photocurrent peak at 1.24 mum originate from the interband transition and inter-subband transition, respectively, in the GalnNAs well. The dark current is as low as 10-8~10-9 A. After annealing, the energy blue shift of the GINA photoluminescence peak decreases with increasing annealing temperature, and the energy difference between the GalnNAs photoluminescence excitation peak and the detection energy decreases with increasing detection energy. The kldrp calculations agree with the above observations.
  • Keywords
    X-ray diffraction; aluminium compounds; annealing; dark conductivity; gallium arsenide; gallium compounds; indium compounds; infrared detectors; photoconductivity; photodetectors; photoluminescence; quantum well devices; semiconductor quantum wells; spectral line shift; GaInNAs-AlAs-AlGaAs; X-ray diffraction; annealing; dark current; double-barrier quantum-well infrared photo-detector; energy blue shift; inter-subband transition; interband transition; kldrp calculations; near-infrared photo-detection; photocurrent spectra; photoluminescence; Annealing; Current measurement; Dark current; Nitrogen; Photoconductivity; Photoluminescence; Quantum wells; Temperature; X-ray diffraction; X-ray scattering;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices and Solid-State Circuits, 2007. EDSSC 2007. IEEE Conference on
  • Conference_Location
    Tainan
  • Print_ISBN
    978-1-4244-0637-1
  • Electronic_ISBN
    978-1-4244-0637-1
  • Type

    conf

  • DOI
    10.1109/EDSSC.2007.4450095
  • Filename
    4450095