• DocumentCode
    2980719
  • Title

    Moisture absorption and autoclave performance optimization of glob top ball grid array

  • Author

    Thompson, Trent A.

  • Author_Institution
    Semicond. Product Sect., Motorola Inc., Austin, TX, USA
  • fYear
    1997
  • fDate
    13-15 Oct 1997
  • Firstpage
    362
  • Lastpage
    368
  • Abstract
    The glob top BGA has been pursued by multiple companies to reduce package cost and cycle time. This report discusses material and process improvements that can be made to enhance the packages´ performance to a JEDEC Level 3. The material evaluations included in this report tested different liquid encapsulants, die attach epoxies and solder resist materials. Process improvements targeted using different cure profiles for the encapsulants, cleaning processes and location of special cleaning in the assembly process. Flag designs that reduce Cu surface area on the substrate for possible better die attach adhesion are also discussed. These results are benchmarked with the overmolded plastic ball grid area (PBGA) performance which is a JEDEC Level 5. The reliability test response was C-SAM to inspect for delamination at various package interfaces and weight gain to determine package moisture absorption and deabsorption rates
  • Keywords
    delamination; encapsulation; integrated circuit packaging; integrated circuit reliability; moisture; surface cleaning; C-SAM; Cu; JEDEC Level 3; absorption rates; autoclave performance optimization; cleaning; cleaning processes; cure profiles; cycle time; deabsorption rates; delamination; die attach adhesion; die attach epoxies; encapsulants; glob top ball grid array; liquid encapsulants; moisture absorption; package cost; reliability test response; solder resist materials; surface area; weight gain; Absorption; Assembly; Cleaning; Costs; Materials testing; Microassembly; Moisture; Optimization; Packaging; Resists;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics Manufacturing Technology Symposium, 1997., Twenty-First IEEE/CPMT International
  • Conference_Location
    Austin, TX
  • ISSN
    1089-8190
  • Print_ISBN
    0-7803-3929-0
  • Type

    conf

  • DOI
    10.1109/IEMT.1997.626946
  • Filename
    626946