DocumentCode
2980719
Title
Moisture absorption and autoclave performance optimization of glob top ball grid array
Author
Thompson, Trent A.
Author_Institution
Semicond. Product Sect., Motorola Inc., Austin, TX, USA
fYear
1997
fDate
13-15 Oct 1997
Firstpage
362
Lastpage
368
Abstract
The glob top BGA has been pursued by multiple companies to reduce package cost and cycle time. This report discusses material and process improvements that can be made to enhance the packages´ performance to a JEDEC Level 3. The material evaluations included in this report tested different liquid encapsulants, die attach epoxies and solder resist materials. Process improvements targeted using different cure profiles for the encapsulants, cleaning processes and location of special cleaning in the assembly process. Flag designs that reduce Cu surface area on the substrate for possible better die attach adhesion are also discussed. These results are benchmarked with the overmolded plastic ball grid area (PBGA) performance which is a JEDEC Level 5. The reliability test response was C-SAM to inspect for delamination at various package interfaces and weight gain to determine package moisture absorption and deabsorption rates
Keywords
delamination; encapsulation; integrated circuit packaging; integrated circuit reliability; moisture; surface cleaning; C-SAM; Cu; JEDEC Level 3; absorption rates; autoclave performance optimization; cleaning; cleaning processes; cure profiles; cycle time; deabsorption rates; delamination; die attach adhesion; die attach epoxies; encapsulants; glob top ball grid array; liquid encapsulants; moisture absorption; package cost; reliability test response; solder resist materials; surface area; weight gain; Absorption; Assembly; Cleaning; Costs; Materials testing; Microassembly; Moisture; Optimization; Packaging; Resists;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronics Manufacturing Technology Symposium, 1997., Twenty-First IEEE/CPMT International
Conference_Location
Austin, TX
ISSN
1089-8190
Print_ISBN
0-7803-3929-0
Type
conf
DOI
10.1109/IEMT.1997.626946
Filename
626946
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