DocumentCode :
2980772
Title :
Embedded lowlight image quality measure
Author :
Pan, Yongjuan ; Wang, Jin
Author_Institution :
Dept. of Appl. Math., Zhejiang Univ. of Technol., Hangzhou, China
fYear :
2012
fDate :
22-24 June 2012
Firstpage :
292
Lastpage :
295
Abstract :
Based on the research on embedded camera user´s attention level, a novel blind image quality ranking and poor appearance detection algorithm for low lighting environment are proposed for the first time. Different from the traditional algorithms, the proposed one mixed model composed of detecting lowlight, grading blur degree and noise level, and figuring out the under- or over-exposure. It reaches the real time performance even on low level embedded devices with the detail feedback of quality score. The experiments show the proposed method performs well and is consistent with human perception.
Keywords :
image restoration; blur degree; embedded lowlight image quality measure; low level embedded devices; noise level; novel blind image quality ranking; poor appearance detection algorithm; quality score; real time performance; Calculators; Computational modeling; Digital video broadcasting; Generators; Humans; Logistics; Noise; embedded imaging; image quality measure; lowlight;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Software Engineering and Service Science (ICSESS), 2012 IEEE 3rd International Conference on
Conference_Location :
Beijing
Print_ISBN :
978-1-4673-2007-8
Type :
conf
DOI :
10.1109/ICSESS.2012.6269463
Filename :
6269463
Link To Document :
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