Title :
Highlights of laser testing capabilities regarding the understanding of SEE in SRAM based FPGAs
Author :
Bocquillon, A. ; Foucard, G. ; Miller, F. ; Buard, N. ; Leveugle, R. ; Daniel, C. ; Rakers, S. ; Carriere, T. ; Pouget, V. ; Velazco, R.
Author_Institution :
EADS Innovation Works, Suresnes, France
Abstract :
This paper presents the applications of pulsed laser experiments for testing the reliability of SRAM-based FPGAs regarding natural radiation environment. The final objective is to understand the basement of configuration memory sensitivity and to highlight the testing possibilities provided by laser fault injection in running application. Static (Virtex 2) and dynamic (Virtex 1) experiments are presented.
Keywords :
SRAM chips; field programmable gate arrays; SRAM based FPGA; Virtex 1; Virtex 2; laser fault injection; laser testing capabilities; natural radiation environment; pulsed laser; running application; Aerodynamics; Automatic control; Circuit faults; Circuit testing; Electronic equipment testing; Field programmable gate arrays; Laboratories; Optical pulses; Radiation safety; Random access memory; SEFI; SRAM Based FPGA; laser-induced single-event effects; static and dynamic testing;
Conference_Titel :
Radiation and Its Effects on Components and Systems, 2007. RADECS 2007. 9th European Conference on
Conference_Location :
Deauville
Print_ISBN :
978-1-4244-1704-9
DOI :
10.1109/RADECS.2007.5205500
