• DocumentCode
    2980822
  • Title

    Simulation tool for the prediction of heavy ion cross section of innovative 130 nm SRAMs

  • Author

    Correas, V. ; Saigné, F. ; Sagnes, B. ; Boch, J. ; Gasiot, G. ; Giot, D. ; Roche, Ph.

  • Author_Institution
    Front-End Technol. & Manuf., STMicroelectronics, Crolles, France
  • fYear
    2007
  • fDate
    10-14 Sept. 2007
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    A simulation tool to predict heavy ions cross-sections of standard SRAMs is applied to innovative SRAMs. From the standard to the innovative structure, input parameters are simply evaluated using Spice simulations. Experimental and simulated cross-sections are then shown to be in good agreement.
  • Keywords
    SRAM chips; electronic engineering computing; Spice simulations; heavy ion cross section; innovative SRAM; size 130 nm; Predictive models; Cross section; Heavy ion; Innovative SRAM; PHISco; SEU;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation and Its Effects on Components and Systems, 2007. RADECS 2007. 9th European Conference on
  • Conference_Location
    Deauville
  • ISSN
    0379-6566
  • Print_ISBN
    978-1-4244-1704-9
  • Type

    conf

  • DOI
    10.1109/RADECS.2007.5205503
  • Filename
    5205503
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2980822