Title :
A quadrature data-dependent DEM algorithm to improve image rejection of a complex /spl Sigma//spl Delta/ modulator
Author :
Breems, Lucien J. ; Dijkmans, E.C. ; Huijsing, J.H.
Author_Institution :
Philips Res. Lab., Eindhoven, Netherlands
Abstract :
A data-dependent DEM algorithm is controlled by the quadrature bitstreams of a complex /spl Sigma//spl Delta/ modulator. The quadrature feedback paths of the modulator are dynamically matched, without increasing the in-band noise. Test chips with an initial 20% mismatch have a typical image rejection ratio of 61 dB with DEM.
Keywords :
sigma-delta modulation; complex sigma-delta modulator; data dependent DEM algorithm; dynamic element matching; image rejection ratio; in-band noise; oversampling ADC; quadrature bitstream; quadrature feedback path; Choppers; Demodulation; Equations; Feedback; Frequency; Impedance; Interference; Quantization; Resistors; Switches;
Conference_Titel :
Solid-State Circuits Conference, 2001. Digest of Technical Papers. ISSCC. 2001 IEEE International
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
0-7803-6608-5
DOI :
10.1109/ISSCC.2001.912540
