DocumentCode
2981244
Title
Investigation on Effects of Uniform Left-Handed Material Layer on Reflection Characteristics of Dielectric Periodic Structure
Author
Fang, Weihai ; Xu, Shanjia
Author_Institution
Univ. of Sci. & Technol. of China, Hefei
fYear
2007
fDate
18-21 April 2007
Firstpage
1
Lastpage
4
Abstract
The effects of left-handed materials (LHM) on frequency selective reflection characteristics of dielectric periodic structures are carefully investigated using a method which combines the multimode network theory with the rigorous mode matching method. It has been shown that the selective behavior of periodic structures can be modified by adding LHM layers above and below the periodic layer.
Keywords
dielectric materials; electromagnetic wave reflection; metamaterials; mode matching; periodic structures; permittivity; dielectric structure; frequency selective reflection; left-handed materials; multimode network theory; periodic structure; permeability; permittivity; reflection characteristics; rigorous mode matching; Dielectric losses; Dielectric materials; Frequency selective surfaces; Metamaterials; Mode matching methods; Periodic structures; Permeability; Permittivity; Reflection; Tellurium;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave and Millimeter Wave Technology, 2007. ICMMT '07. International Conference on
Conference_Location
Builin
Print_ISBN
1-4244-1049-5
Electronic_ISBN
1-4244-1049-5
Type
conf
DOI
10.1109/ICMMT.2007.381339
Filename
4266098
Link To Document