DocumentCode :
2981265
Title :
A Theoretical Approach Based on the Correlation of Unified Data for Different Analyzing Techniques Used in the Modern Investigation of Artworks
Author :
Laurentiu-Marian, Angheluta ; Alexandros, Rigas
Author_Institution :
Nat. Inst. of Res. & Dev. for Optoelectron., Magurele, Romania
fYear :
2010
fDate :
6-8 Sept. 2010
Firstpage :
89
Lastpage :
92
Abstract :
In this paper we present an approach based on mathematical and computing aspects of a method for the correlation of images representing investigation results over the same area of an object. The aim of this algorithm is to associate the results with a three-dimensional digital model of the investigated surface in an accurate manner. Thus a digital replica can be obtained with unified and complementary data provided by different analyzing devices. Several devices for the investigation of artifacts´ surfaces, as laser induced fluorescence scanning, laser Doppler vibrometry scanning, multispectral imaging and thermal imaging, have been used. These devices are well-known in the field of modern investigation techniques for the conservation of artwork objects, as they use non-contact and non-destructive means of analyzing, without preliminary sampling and with a real-time response. Moreover, the three-dimensional digital replica of the surface, obtained with a 3-D laser scanner, will be the support for the unified investigation data.
Keywords :
art; fluorescence; image processing; infrared imaging; nondestructive testing; optical scanners; solid modelling; vibration measurement; 3-D laser scanner; artwork object; complementary data; digital replica; laser Doppler vibrometry scanning; laser induced fluorescence scanning; multispectral imaging; thermal imaging; three-dimensional digital model; unified data; Cameras; Image resolution; Laser beams; Laser modes; Measurement by laser beam; Optical surface waves; Surface emitting lasers; 3-D digital replica; data overlapping;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Developments in E-systems Engineering (DESE), 2010
Conference_Location :
London
Print_ISBN :
978-1-4244-8044-9
Type :
conf
DOI :
10.1109/DeSE.2010.22
Filename :
5629956
Link To Document :
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