• DocumentCode
    2981313
  • Title

    Study of single-event transients in high-speed operational amplifiers

  • Author

    Jaulent, P. ; Pouget, V. ; Lewis, D. ; Fouillat, P.

  • Author_Institution
    IMS Lab., Univ. of Bordeaux 1, Talence, France
  • fYear
    2007
  • fDate
    10-14 Sept. 2007
  • Firstpage
    1
  • Lastpage
    7
  • Abstract
    This paper presents a simulation and experimental study of the analog single-event transient sensitivity of wide bandwidth operational amplifiers. Architecture effects are presented that could influence ASIC design and COTS selection.
  • Keywords
    operational amplifiers; wideband amplifiers; ASIC design; COTS selection; high-speed operational amplifiers; single-event transients; wide bandwidth operational amplifiers; Application specific integrated circuits; Bandwidth; Circuit simulation; Extraterrestrial phenomena; Filters; Frequency; Operational amplifiers; Polarization; Space technology; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation and Its Effects on Components and Systems, 2007. RADECS 2007. 9th European Conference on
  • Conference_Location
    Deauville
  • ISSN
    0379-6566
  • Print_ISBN
    978-1-4244-1704-9
  • Type

    conf

  • DOI
    10.1109/RADECS.2007.5205524
  • Filename
    5205524
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2981313