Title :
A review of Xilinx FPGA architectural reliability concerns from Virtex to Virtex-5
Author :
Quinn, Heather ; Morgan, Keith ; Graham, Paul ; Krone, Jim ; Caffrey, Michael
Author_Institution :
ISR-3 Space Data Syst., Los Alamos Nat. Lab., Los Alamos, NM, USA
Abstract :
This paper presents heavy ion static results for Xilinx field-programmable gate arrays (FPGAs). The paper analyzes static bit cross-sections, resources, multiplebit upsets (MBUs) and resource effects for implications to triple-modular redundancy.
Keywords :
SRAM chips; circuit reliability; field programmable gate arrays; SRAM; Virtex-5; Xilinx FPGA architectural reliability concerns; field-programmable gate arrays; multiplebit upsets; resource effects; static random access memory; triple-modular redundancy; Application specific integrated circuits; Driver circuits; Field programmable gate arrays; Hardware; Laboratories; Random access memory; Single event transient; Testing; Turning; Wiring;
Conference_Titel :
Radiation and Its Effects on Components and Systems, 2007. RADECS 2007. 9th European Conference on
Conference_Location :
Deauville
Print_ISBN :
978-1-4244-1704-9
DOI :
10.1109/RADECS.2007.5205533
