DocumentCode
2981542
Title
A review of Xilinx FPGA architectural reliability concerns from Virtex to Virtex-5
Author
Quinn, Heather ; Morgan, Keith ; Graham, Paul ; Krone, Jim ; Caffrey, Michael
Author_Institution
ISR-3 Space Data Syst., Los Alamos Nat. Lab., Los Alamos, NM, USA
fYear
2007
fDate
10-14 Sept. 2007
Firstpage
1
Lastpage
8
Abstract
This paper presents heavy ion static results for Xilinx field-programmable gate arrays (FPGAs). The paper analyzes static bit cross-sections, resources, multiplebit upsets (MBUs) and resource effects for implications to triple-modular redundancy.
Keywords
SRAM chips; circuit reliability; field programmable gate arrays; SRAM; Virtex-5; Xilinx FPGA architectural reliability concerns; field-programmable gate arrays; multiplebit upsets; resource effects; static random access memory; triple-modular redundancy; Application specific integrated circuits; Driver circuits; Field programmable gate arrays; Hardware; Laboratories; Random access memory; Single event transient; Testing; Turning; Wiring;
fLanguage
English
Publisher
ieee
Conference_Titel
Radiation and Its Effects on Components and Systems, 2007. RADECS 2007. 9th European Conference on
Conference_Location
Deauville
ISSN
0379-6566
Print_ISBN
978-1-4244-1704-9
Type
conf
DOI
10.1109/RADECS.2007.5205533
Filename
5205533
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