Title :
An organic and ceramic laminated BGA package with high thermal and electrical performance characteristics
Author :
Asai, Hironori ; Yano, Kei-ichi ; Iyogi, Kiyoshi ; Iwase, Nobuo ; Fujiwara, Tatsuo
Author_Institution :
Toshiba Corp., Yokohama, Japan
Abstract :
A new structural face-up LSI package has been developed. The package shows low thermal resistance without a heatsink and low inductance, capacitance, and resistance values. The package is thin enough for portable multimedia equipment applications, with a thickness of 0.5 mn (not including ball height). The measured thermal resistance was 11°C/W under natural convection without a heatsink. The simulated inductance and capacitance were 6.7 nH and 1.1 pF respectively, and measured resistance was 520 mΩ (line length=14.7 mm, width=60 μm). The package consists of a resin film and a ceramic substrate. The film is a liquid crystal polymer (LCP) and the substrate is aluminum nitride (AlN). LCP is a suitable material for buried-bump interconnection technology (B2itTM). AlN has high thermal conductivity and its coefficient of thermal expansion (CTE) is close to that of silicon. Both materials were laminated by an adhesive agent. This material combination provides a thin structure, low thermal resistance, and low LCR which are suitable for portable multimedia electrical equipment. This paper reports the configuration and performance characteristics of this newly developed package
Keywords :
cooling; integrated circuit packaging; laminates; large scale integration; natural convection; thermal expansion; thermal resistance; 0.5 mm; 520 mohm; AlN; adhesive agent; buried-bump interconnection technology; capacitance; ceramic laminated BGA package; coefficient of thermal expansion; electrical performance characteristics; inductance; natural convection; portable multimedia equipment applications; resistance; structural face-up LSI package; thermal conductivity; thermal resistance; Capacitance; Ceramics; Conducting materials; Crystalline materials; Electrical resistance measurement; Packaging machines; Resistance heating; Substrates; Thermal conductivity; Thermal resistance;
Conference_Titel :
Electronics Manufacturing Technology Symposium, 1997., Twenty-First IEEE/CPMT International
Conference_Location :
Austin, TX
Print_ISBN :
0-7803-3929-0
DOI :
10.1109/IEMT.1997.626950